Principles Of Operation

Smart Junction Box (SJB)

Principles of Operation

NOTE: The Smart Junction Box (SJB) is also known as the Generic Electronic Module (GEM).

The SJB (Smart Junction Box) controls various systems by monitoring inputs from switches, sensors and messages sent from other modules on the Medium Speed Controller Area Network (MS-CAN). Based on the inputs received, the SJB (Smart Junction Box) activates outputs. For example, the SJB (Smart Junction Box) monitors the headlamp switch position. Based on this input, the SJB (Smart Junction Box) may provide voltage to the exterior lamps.

Field-Effect Transistor (FET) Protection

A Field-Effect Transistor (FET) is a type of transistor that when used with module software can be used to monitor and control current flow on module outputs. The FET (Field-Effect Transistor) protection strategy is used to prevent module damage in the event of excessive current flow.

The SJB (Smart Junction Box) utilizes an FET (Field-Effect Transistor) protective circuit strategy for many of its outputs (for example, a headlamp output circuit). Output loads (current level) are monitored for excessive current (typically short circuits) and are shut down (turns off the voltage or ground provided by the module) when a fault event is detected. A short circuit DTC is stored at the fault event and a cumulative counter is started.

When the demand for the output is no longer present, the module resets the FET (Field-Effect Transistor) circuit protection to allow the circuit to function. The next time the driver requests a circuit to activate that has been shut down by a previous short (FET (Field-Effect Transistor) protection) and the circuit is still shorted, the FET (Field-Effect Transistor) protection shuts off the circuit again and the cumulative counter advances.

When the excessive circuit load occurs often enough, the module shuts down the output until a repair procedure is carried out. Each FET (Field-Effect Transistor) protected circuit has 3 predefined levels of short circuit tolerance based on the harmful effect of each circuit fault on the FET (Field-Effect Transistor) and the ability of the FET (Field-Effect Transistor) to withstand it. A module lifetime level of fault events is established based upon the durability of the FET (Field-Effect Transistor). If the total tolerance level is determined to be 600 fault events, the 3 predefined levels would be 200, 400 and 600 fault events.

When each tolerance level is reached, the short circuit DTC that was stored on the first failure cannot be cleared by a command to clear the continuous DTCs. The module does not allow this code to be cleared or the circuit restored to normal operation until a successful self-test proves that the fault has been repaired. After the self-test has successfully completed (no on-demand DTCs present), DTC B106E and the associated DTC (the DTC related to the shorted circuit) automatically clears and the circuit function returns.

When each level is reached, the DTC associated with the short circuit sets along with DTC B106E. These DTCs can be cleared using the module on-demand self-test, then the Clear DTC operation on the scan tool (if the on-demand test shows the fault corrected). The module never resets the fault event counter to zero and continues to advance the fault event counter as short circuit fault events occur.

If the number of short circuit fault events reach the third level, then DTCs B106F and B1342 set along with the associated short circuit DTC. DTC B106F cannot be cleared and the module must be replaced after the repair.